Adaptation of an event-driven simulation environment to sequentially propagated concurrent fault simulation
Authors: 
M. Zolfy, S. Mirkhani, Z. NavabiAuthors Info & Claims
M. Zolfy, S. Mirkhani, Z. NavabiAuthors Info & ClaimsAbstract
No abstract available.
References
[1]
M. Abramovici, M. A. Breuer, A. D. Friedman, "Digital System Testing and Testable Design," Computer Science Press, 1990.
[2]
Z. Navabi, "VHDL: Analysis and Modeling of Digital Systems," Mc Graw Hill, 1998.
[3]
E. G. Ulrich and T. G. Baker, "Concurrent Simulation of Nearly Identical Digital Networks," Computer, Vol. 7, No. 4, pp. 39-44, April 1974.
Index Terms
- Adaptation of an event-driven simulation environment to sequentially propagated concurrent fault simulation
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- EDAA: European Design Automation Association
- IFIP WG 10.5: IFIP WG 10.5
- ECSI
- EDAC: Electronic Design Automation Consortium
- SIGDA: ACM Special Interest Group on Design Automation
- IEEE-CS\TTTC: Test Technology Technical Council
- IEEE-CS\DATC: IEEE Computer Society
- The Russian Academy of Sciences: The Russian Academy of Sciences
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IEEE Press
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Published: 13 March 2001
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- EDAA
- IFIP WG 10.5
- EDAC
- SIGDA
- IEEE-CS\TTTC
- IEEE-CS\DATC
- The Russian Academy of Sciences
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Overall Acceptance Rate 518 of 1,794 submissions, 29%
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