Towards a better understanding of failure modes and test requirements of ADCs
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- Towards a better understanding of failure modes and test requirements of ADCs
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- EDAA: European Design Automation Association
- IFIP WG 10.5: IFIP WG 10.5
- ECSI
- EDAC: Electronic Design Automation Consortium
- SIGDA: ACM Special Interest Group on Design Automation
- IEEE-CS\TTTC: Test Technology Technical Council
- IEEE-CS\DATC: IEEE Computer Society
- The Russian Academy of Sciences: The Russian Academy of Sciences
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- IFIP WG 10.5
- EDAC
- SIGDA
- IEEE-CS\TTTC
- IEEE-CS\DATC
- The Russian Academy of Sciences
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