The Core Test Language, originally developed within the IEEE 1500 development working group but later spun out as an independent standard, specifies the standardized language in which core test information for both wrapped and still-to-be-wrapped cores ...

Fault tolerance capabilities are becoming a fundamental requirement in many designs. Improving these systems' dependability under demanding environmental and operating conditions requires new techniques that use concurrent error detection (CED) ...

The authors lightheartedly discuss the importance of standards like IEEE 1500, emphasizing a few "side benefits," such as the positive impact on the economy from all the traveling involved in discussing and debating a standard. Perhaps, the authors ...

Tool support is crucial in widespread adoption of a standard. This article describes a set of tools and associated flow for DFT insertion and test generation based on IEEE Std 1500.

In his keynote address at the 2007 International Test Conference, Gadi Singer (vice president of the Mobility Group and general manager of the SOC Enabling Group at Intel) provided Intel's perspective on evolving computing trends, continuing and future ...

This article describes the test wrapper implementation of a popular embedded microprocessor, along with an automated approach for verifying the wrapper's compliance to the standard.

Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.

This article presents a mathematical model and algorithm that address the problem of logic function mapping in a nanoelectronic environment. Enhancement techniques improve the algorithm's runtime by significantly cutting down on unnecessary backtracking ...

IEEE Std 1500 enables automation and hence allows for easier and faster integration of embedded cores into an SoC. This article describes an automated test development system based on the concept of embedded test.

IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case ...

IEEE Std 1500 supports cost-efficient testing of core-based SoCs. Several popular commercial cores have incorporated IEEE-1500-compliant wrappers, and many complex SoC designs have successfully employed a modular-testing strategy enabled by this ...

The increased use of embedded predesigned reusable cores necessitates a core-based test strategy. The goal of IEEE Std 1500-2005 is to simplify reuse and facilitate interoperability for testing core-based system chips, especially if they contain cores ...

This article presents a CMOS resizing methodology for analog circuits during a technology migration, with easy-to-apply scaling rules based on a simple MOS transistor model. The goals are to transpose a circuit topology from one technology to another ...

Incremental advances in semiconductor device testing have improved device quality and reliability. New test methods applied to dies at the wafer level are now significantly improving the reliability of devices sold to the increasing bare-die market and ...

This is the first of two roundtables on electronic system-level design in this issue of IEEE Design & Test. ESL design and tools have been present in the design landscape for many years. Significant ESL innovations are now part of most advanced ...

Networks on chips constitute a new design paradigm for communication infrastructures in large multiprocessor SoCs. NoCs can use the GALS technique to address the difficulty of distributing a synchronous clock signal on the entire chip area. This article ...

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The need for defect maps and per-chip placement and routing limits the efficiency of test and defect tolerance techniques in nanoscale crossbar-based devices. The authors propose a method using two simulation programs that circumvents these difficulties ...

Many articles have been written on testability cost functions and measures. Most of them point to the work of Lawrence Goldstein as one of the first major contributions in this field.4 In this column, I will describe my personal familiarity with some of ...