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- posterMay 2008
Guided test generation for isolation and detection of embedded trojans in ics
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 363–366https://doi.org/10.1145/1366110.1366196Testing the genuineness of a manufactured chip is an important step in an IC product life cycle. This becomes more prominent with the outsourcing of the manufacturing process, since the manufacturer may tamper the internal circuit behavior using Trojan ...
- posterMay 2008
Efficient and optimal post-layout double-cut via insertion by network relaxation and min-cost maximum flow
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 359–362https://doi.org/10.1145/1366110.1366195As VLSI design complexity is continuously increasing, the yield loss due to via failure becomes more significant. Adding a redundant via adjacent to each single via is a well-known and highly recommended method to reduce yield loss due to via failure. ...
- posterMay 2008
Using reiterative LFSR based X-masking to increase output compression in presence of unknowns
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 355–358https://doi.org/10.1145/1366110.1366194This paper addresses the problem of increasing unknowns in the output response data by exploring reiterative LFSR reseeding based X-masking. This approach takes advantage of the data correlation in the output response data to enable LFSR encoded masks ...
- research-articleMay 2008
Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languages
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 297–302https://doi.org/10.1145/1366110.1366181Radiation induced single-event upsets are becoming an increasing issue for designers due to the impact on overall design reliability. This paper presents a method for translating probabilistic information from lower levels in the design hierarchy into ...
- research-articleMay 2008
NBTI resilient circuits using adaptive body biasing
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 285–290https://doi.org/10.1145/1366110.1366179Reliability has become a practical concern in today's VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance warnings before system errors occur. This paper presents a reliability monitor ...
- research-articleMay 2008
On efficient generation of instruction sequences to test for delay defects in a processor
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 279–284https://doi.org/10.1145/1366110.1366178We present a technique that deals with the problem of efficiently generating instruction sequences to test for delay defects in a processor. These instruction sequences are loaded into the cache of a processor and the processor is run in its normal ...
- research-articleMay 2008
A novel test-data compression technique using application-aware bitmask and dictionary selection methods
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 83–88https://doi.org/10.1145/1366110.1366132Higher circuit densities in System-on-Chip (SOC) designs have led to enhancement in the test data volume. Larger test data size demands not only greater memory requirements, but also an increase in the testing time. Test data compression addresses this ...
- research-articleMay 2008
On-die CMOS voltage droop detection and dynamiccompensation
GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSIPages 35–40https://doi.org/10.1145/1366110.1366122This paper describes an on-die di/dt voltage droop compensation scheme for use in high current, low voltage, VLSI circuits using current injection. The circuit was designed and simulated with SPICE. The circuit is able to source up to 150mA of current ...
