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- ArticleOctober 2003
Aggressive Test Power Reduction Through Test Stimuli Transformation
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain modification methodology that transforms the stimuli to be inserted to the ...
- ArticleOctober 2003
A Study of Hardware Techniques That Dynamically Exploit Frequent Operands to Reduce Power Consumption in Integer Function Units
We analyze three different techniques, namely, memoing (caching results that can be reused), narrow-width operand exploitation (limiting computation to low order bytes), and byte encoding (computation performed over significant bytes) that dynamically ...