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- short-paperJune 2022
Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied Tests
GLSVLSI '22: Proceedings of the Great Lakes Symposium on VLSI 2022Pages 345–349https://doi.org/10.1145/3526241.3530359Improving the quality of a test set without storing additional tests is important when a higher fault coverage is required but test data storage is limited. Such an improvement can be achieved by using every test in a base test set to apply several ...
