Article

A delay metric for RC circuits based on the Weibull distribution

Authors:

Frank Liu,

Chandramouli Kashyap,

Charles J. AlpertAuthors Info & Claims

ICCAD '02: Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design

Pages 620 - 624

https://doi.org/10.1145/774572.774664

Published: 10 November 2002 Publication History

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Abstract

Physical design optimizations such as placement, interconnect synthesis, oorplanning, and routing require fast and accurate analysis of RC networks. Because of its simple close form and fast evaluation, the Elmore delay metric has been widely adopted. The recently proposed delay metrics PRIMO and H-gamma match the rst three circuit moments to the probability density function of a Gamma statistical distribution. Although these methods demonstrate impressive accuracy compared to other delay metrics, their implementations tend to be challenging. As an alternative to matching to the Gamma distribution, we propose to match the rst two circuit moments to a Weibull distribution. The result is a new delay metric called Weibull based Delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efciency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracies at both near and far-end nodes.

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Cited By

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Zeng JChen CDe Micheli GAl-Hashimi BMueller WMacii E(2010)Interconnect delay and slew metrics using the beta distributionProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871245(1329-1332)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871245
Sun PLuo RCheng CReda S(2009)Closed-form solution for timing analysis of process variations on SWCNT interconnectProceedings of the 11th international workshop on System level interconnect prediction10.1145/1572471.1572476(19-26)Online publication date: 26-Jul-2009
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Kar RMal ABhattacharjee A(2009)An accurate slew metric for on-chip VLSI interconnect using Weibull distribution functionProceedings of the International Conference on Advances in Computing, Communication and Control10.1145/1523103.1523224(601-604)Online publication date: 23-Jan-2009
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A delay metric for RC circuits based on the Weibull distribution

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Published In

ICCAD '02: Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design

November 2002

793 pages

ISBN:0780376072

DOI:10.1145/774572

General Chair:
Lawrence T. Pileggi
Carnegie Mellon Univ., Pittsburgh, PA
,
Program Chair:
Andreas Kuehlmann
Cadence Berkeley Labs., Berkeley, CA

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 10 November 2002

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ICCAD02: 2002 IEEE / ACM International Conference on Computer Aided Design

November 10 - 14, 2002

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Cited By

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Zeng JChen CDe Micheli GAl-Hashimi BMueller WMacii E(2010)Interconnect delay and slew metrics using the beta distributionProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871245(1329-1332)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871245
Sun PLuo RCheng CReda S(2009)Closed-form solution for timing analysis of process variations on SWCNT interconnectProceedings of the 11th international workshop on System level interconnect prediction10.1145/1572471.1572476(19-26)Online publication date: 26-Jul-2009
https://dl.acm.org/doi/10.1145/1572471.1572476
Kar RMal ABhattacharjee A(2009)An accurate slew metric for on-chip VLSI interconnect using Weibull distribution functionProceedings of the International Conference on Advances in Computing, Communication and Control10.1145/1523103.1523224(601-604)Online publication date: 23-Jan-2009
https://dl.acm.org/doi/10.1145/1523103.1523224
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Ghanta PVrudhula S(2006)Variational Interconnect Delay Metrics for Statistical Timing AnalysisProceedings of the 7th International Symposium on Quality Electronic Design10.1109/ISQED.2006.143(19-24)Online publication date: 27-Mar-2006
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Agarwal MAgarwal KSylvester DBlaauw DTang T(2005)Statistical modeling of cross-coupling effects in VLSI interconnectsProceedings of the 2005 Asia and South Pacific Design Automation Conference10.1145/1120725.1120922(503-506)Online publication date: 18-Jan-2005
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