"A 28nm high density 1R/1W 8T-SRAM macro with screening circuitry against ..."

Makoto Yabuuchi et al. (2013)

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DOI: 10.1109/CICC.2013.6658451

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Makoto Yabuuchi, Hidehiro Fujiwara, Yasumasa Tsukamoto, Miki Tanaka, Shinji Tanaka, Koji Nii:
A 28nm high density 1R/1W 8T-SRAM macro with screening circuitry against read disturb failure. CICC 2013: 1-4

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